Three electron microscopes are available at ICSM:
The Quanta 200 ESEM FEG Scanning electron microscope allows for the "conventionnal" characterization of solids. The ESEM configuration have been defined in order to use the microscope as a chemical reactor and to perform in situ experiments. Specific sampler holders can be attached to the microscope such a High Temperature stage (from room temperature to 1500°C), a Peltier stage (relative humidity and temperature control), a STEM stage and a Wet-STEM stage. The EDX analyser (BRUKER XFlash® 5010 SDD) which is associated with the microscope allows for performing qualitative and quantitative microanalyses.
The JEOL 200CX transmission electron microscope is a conventional TEM equipped with an EDX (BRUKER XFlash® 5030 SDD) analyser. It is equipped with a digital camera (Photonic Science). The point-to-point resolution of this microscope is 0.25 nm.
For further information, please contact X. Le Goff (+33 4 66 39 70 37) or H.-P. Brau (+33 4 66 79 14 48)
In the same field:
Main page / X-Ray Diffractometer / SWAXS bench / Thermal analysis / Electron Microscopes / NMR / ICP / UV / IR / Raman / Fluo X / Surface tension apparatus / Surface analysers / PAC Balard